As a new option, YXLON now also provides the ASTM E2973 Digital Reference Images for Aluminum and Magnesium Die Castings in its imaging software Image2500 and Image3500 for X-ray inspection systems including Y.MU2000-D and MU60 AE. The reference images, which so far have only been available as an image catalog for radiographic inspections with film, can now be deployed in digital radioscopy for defect evaluation of Aluminum and Magnesium alloys in die castings via a second review monitor.
YXLON International, worldwide leading producer of X-ray and CT systems for industrial applications and Renault Sport Formula One™ Team announce the successful start of their technical partnership. YXLON has provided its proven Y.MU2000-D X-ray system as a premium version which includes the Variofocus X-ray tube, High-Dynamic Radioscopy (HDR) as well as computed tomography (CT). Renault Sport Formula One™ Team can now conduct most of their inspection tasks for quality assurance and R&D with this universal X-ray inspection system, thus optimizing their testing processes.
A Better Image For Demanding Applications
As new technologies emerge, they push x-ray systems to evolve and adopt new methods of imaging in difficult materials and locations. One of today's more prevalent and demanding areas that x-ray systems has been able to provide a solution is in microelectronics.
X-ray inspection has long been a preferred way to obtain non-destructive quality data on manufactured parts. With the advent of digital X-ray systems, improved imaging capabilities, and more powerful computers, many manufacturers have come to rely on non-destructive X-ray test systems to make pass/fail decisions on individual parts. This is called Automatic Defect Recognition or ADR.
Although previous YXLON publications have described the general principles of ADR, our latest paper, "Going Beyond Pass/Fail with Automatic Defect Recognition" focuses on two particular applications of ADR technology: fully automated X-ray inspection as part of a manufacturing process and ensuring increased security via ADR.
The Tube Is The Heart of the SystemWithin the realm of X-ray inspection for electronics there are a wide range of applications, so a single type of X-ray tube is not a "one-size-fits-all" solution. To address the demands of industries such as electronics manufacturing, better X-ray system manufacturers offer various non-destructive test solutions based on the power, kV and feature recognition capabilities electronics producers need. Having a choice of tubes and features allow the makers of chips, boards, circuits and compontents to obtain the images they need to resolve their production issues quickly and accurately.
At this year’s Control: International Trade Fair for Quality Assurance, held April 26-29 in Stuttgart, Germany, we found many reasons to celebrate our 2016 focus on “A Step Ahead in Metrology.” The YXLON booth featured our new FF20 CT and FF35 CT with live demonstrations and the new software system release 1.2. The show was successful for us, and we enjoyed many interesting customer talks.
‘Micro3Dslices’ gives operators one of the most accurate Laminography solutions in the market today, surpassing the current market benchmark. Bernhard Muerkens, VP Electronics said: “This exciting technology takes Laminography to a whole new level and gives clearly superior results much faster, really moving this technology into the semiconductor area. The new virtual rotation axis and unprecedented precision of the new manipulator assembly provide unrivalled inspection results, simplified operation and higher inspection throughput.”This solution is much more accurate than previous versions, due, in part, to the quality of design and engineering in the new manipulator assembly, allowing smaller and less dense features to be imaged than it was previously possible. This new technology produces vastly superior laminography results, when compared to other systems which revolve the detector or use inferior manipulators.
Following intensive test operation during production involving more than 250,000 inspected wheels, YXLON has officially launched the new WI26 G wheel inspection system with ADR and the new YXLON Panel 460 detector on the market in the course of its Wheel Symposium 2016. The design for the new WI26 G has been geared for speed, inspection decision-making at its best, and minimum maintenance requirements. “With this wheel inspection system we are able to double our production throughput,” is the enthusiastic commentary from Chris Puhlmann at Borbet Solingen about the concept’s success. At less than 20 seconds of inspection time per standard wheel, an annual throughput of 1.5 million inspected wheels is being applied as the basis. Which makes the WI26 G the fastest X-ray system in its class.
The “open” transmission X-ray tube was a major step forward for x-ray inspection. This technology itself is almost 55 years old, but was adopted for X-ray inspection for electronics in 1982 when the German company Feinfocus introduced the first open Microfocus tube. Most modern high technology electronics systems use Open Tubes.
Hamburg, 15.02.2016. With the new release of the FF20 CT und FF35 CT systems for computed tomography and thanks to a brand-new 190 kV nanofocus tube, YXLON now achieves in the case of 2D applications an as yet unparalleled detail visibility ≤ 150 nm even at high energies. New CT algorithms provide optimum spacial resolution and care for highest precision and time efficiency at a large range of CT applications. With this new release, the systems consequently deliver the best inspection results during the non-destructive testing of materials and furthermore fulfill the most important prerequisites for demanding metrology applications.