Industrial Computed Tomography for Composites: Webinar Nov. 8th

Posted by Dirk Steiner on Oct 14, 2016 6:28:10 AM

You are invited to attend a free CompositesWorld.com webinar to learn how computed tomography (CT) can be used for the inspection of fiber orientation.

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Topics: CT

ASTM E2973 Digital Reference Images for Aluminum and Magnesium Die Castings

Posted by Jeannine Memminger-Adamski on Aug 11, 2016 11:16:40 AM

As a new option, YXLON now also provides the ASTM E2973 Digital Reference Images for Aluminum and Magnesium Die Castings in its imaging software Image2500 and Image3500 for X-ray inspection systems including Y.MU2000-D and MU60 AE. The reference images, which so far have only been available as an image catalog for radiographic inspections with film, can now be deployed in digital radioscopy for defect evaluation of Aluminum and Magnesium alloys in die castings via a second review monitor.

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Topics: ASTM, Die Casting

Inauguration of MU2000-D at Renault Formula One Team Technical Centre

Posted by Gina Naujokat on Jul 26, 2016 8:06:34 AM

YXLON International, worldwide leading producer of X-ray and CT systems for industrial applications and Renault Sport Formula One™ Team announce the successful start of their technical partnership. YXLON has provided its proven Y.MU2000-D X-ray system as a premium version which includes the Variofocus X-ray tube, High-Dynamic Radioscopy (HDR) as well as computed tomography (CT). Renault Sport Formula One™ Team can now conduct most of their inspection tasks for quality assurance and R&D with this universal X-ray inspection system, thus optimizing their testing processes.

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Topics: CT, non destructive testing, formula 1, NDT, computed tomography

Advances in X-Ray Inspection For Electronics, Part 3: Microelectronics

Posted by Friedhelm Maur on Jul 21, 2016 8:06:55 AM

A Better Image For Demanding Applications

As new technologies emerge, they push x-ray systems to evolve and adopt new methods of imaging in difficult materials and locations. One of today's more prevalent and demanding areas that x-ray systems has been able to provide a solution is in microelectronics. 


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Topics: NDT, Electronics

Going Beyond Pass/Fail with Automotic Defect Recognition (ADR)

Posted by Jeannine Memminger-Adamski on Jun 23, 2016 6:39:03 AM


X-ray inspection has long been a preferred way to obtain non-destructive quality data on manufactured parts. With the advent of digital X-ray systems, improved imaging capabilities, and more powerful computers, many manufacturers have come to rely on non-destructive X-ray test systems to make pass/fail decisions on individual parts. This is called Automatic Defect Recognition or ADR.

Although previous YXLON publications have described the general principles of ADR, our latest paper, "Going Beyond Pass/Fail with Automatic Defect Recognition" focuses on two particular applications of ADR technology: fully automated X-ray inspection as part of a manufacturing process and ensuring increased security via ADR.  

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Topics: ADR

Advances in X-ray Inspection for Electronics, Part 2: Which Tube?

Posted by Friedhelm Maur on Jun 9, 2016 6:00:00 AM

The Tube Is The Heart of the System

Within the realm of X-ray inspection for electronics there are a wide range of applications, so a single type of X-ray tube is not a "one-size-fits-all" solution. To address the demands of industries such as electronics manufacturing, better X-ray system manufacturers offer various non-destructive test solutions based on the power, kV and feature recognition capabilities electronics producers need. Having a choice of tubes and features allow the makers of chips, boards, circuits and compontents to obtain the images they need to resolve their production issues quickly and accurately.
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Topics: NDT

Metrology Figures Large at Control 2016: International Trade Fair

Posted by Andrea Siems on May 26, 2016 6:09:41 AM

At this year’s Control: International Trade Fair for Quality Assurance, held April 26-29 in Stuttgart, Germany, we found many reasons to celebrate our 2016 focus on A Step Ahead in Metrology.” The YXLON booth featured our new FF20 CT and FF35 CT with live demonstrations and the new software system release 1.2. The show was successful for us, and we enjoyed many interesting customer talks.

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Topics: metrology

YXLON International is proud to announce the latest technology advances to their market leading FeinFocus product range for electronics applications.

Posted by Gina Naujokat on Apr 25, 2016 5:05:03 AM

‘Micro3Dslices’ gives operators one of the most accurate Laminography solutions in the market today, surpassing the current market benchmark. Bernhard Muerkens, VP Electronics said: “This exciting technology takes Laminography to a whole new level and gives clearly superior results much faster, really moving this technology into the semiconductor area. The new virtual rotation axis and unprecedented precision of the new manipulator assembly provide unrivalled inspection results, simplified operation and higher inspection throughput.”This solution is much more accurate than previous versions, due, in part, to the quality of design and engineering in the new manipulator assembly, allowing smaller and less dense features to be imaged than it was previously possible. This new technology produces vastly superior laminography results, when compared to other systems which revolve the detector or use inferior manipulators.

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Topics: Y.Cheetah, NDT, SMT, Laminography, Semicon

Enthusiastic response to new wheel inspection system from YXLON

Posted by Gina Naujokat on Mar 29, 2016 7:01:29 AM

Following intensive test operation during production involving more than 250,000 inspected wheels, YXLON has officially launched the new WI26 G wheel inspection system with ADR and the new YXLON Panel 460 detector on the market in the course of its Wheel Symposium 2016. The design for the new WI26 G has been geared for speed, inspection decision-making at its best, and minimum maintenance requirements. “With this wheel inspection system we are able to double our production throughput,” is the enthusiastic commentary from Chris Puhlmann at Borbet Solingen about the concept’s success. At less than 20 seconds of inspection time per standard wheel, an annual throughput of 1.5 million inspected wheels is being applied as the basis. Which makes the WI26 G the fastest X-ray system in its class.

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Topics: industrial x-ray inspection, non destructive testing, NDT, system release, wheel

Advances in X-ray Inspection for Electronics, Part 1: Tubes

Posted by Friedhelm Maur on Mar 22, 2016 9:09:37 AM

Origin Story

The “open” transmission X-ray tube was a major step forward for x-ray inspection. This technology itself is  almost 55 years old, but was adopted for X-ray inspection for electronics in 1982 when the German company Feinfocus introduced the first open Microfocus tube. Most  modern high technology electronics systems use Open Tubes.

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Topics: NDT

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