YXLON Blog

Control 2017 - YXLON sets the focus on metrology

Posted by Gina Naujokat on May 8, 2017 7:41:18 AM

YXLON, May 8, 2017: This year’s trade-fair presentation from YXLON is going to revolve primarily around the topic of metrology using computed tomography. The main attraction: a new version of the CT systems YXLON FF20 CT and YXLON FF35 CT will be presented that is targeted to appeal to metrologists.

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Topics: CT, industrial ct, metrology, computed tomography

Christian Gueck is new head of YXLON Inspection Services

Posted by Gina Naujokat on Nov 28, 2016 6:22:21 AM

YXLON, November 28, 2016: Christian Gück took over the management of YXLON Inspection Services and will promote the expansion of the inspection services for customers worldwide. Especially dimensional metrology by means of computed tomography poses considerable challenges both to X-ray systems and inspectors. Gück, who had already focused on metrology during his studies, had the opportunity to gain extended experience in the field of conventional measuring methods like tactile or optical technologies as well as CT Metrology during several years with a renowned German company. “During that time I specialized and focused on dimensional measuring by computed tomography because in the framework of the initiative Industry 4.0 and completely new production technologies it means a great future market. As the person responsible for CT inspection services on site, and during numerous customer training sessions I had the chance to learn about customer requirements and demands in very diverse industries”, Gück says.

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Topics: CT, industrial ct, metrology, inspection services

Metrology Figures Large at Control 2016: International Trade Fair

Posted by Andrea Siems on May 26, 2016 6:09:41 AM

At this year’s Control: International Trade Fair for Quality Assurance, held April 26-29 in Stuttgart, Germany, we found many reasons to celebrate our 2016 focus on A Step Ahead in Metrology.” The YXLON booth featured our new FF20 CT and FF35 CT with live demonstrations and the new software system release 1.2. The show was successful for us, and we enjoyed many interesting customer talks.

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Topics: metrology

Press Release: YXLON CT Systems – Unprecedented detail visibility ≤ 150 nm for precise results during inspection and metrology tasks

Posted by Gina Naujokat on Feb 15, 2016 10:26:01 AM

Hamburg, 15.02.2016. With the new release of the FF20 CT und FF35 CT systems for computed tomography and thanks to a brand-new 190 kV nanofocus tube, YXLON now achieves in the case of 2D applications an as yet unparalleled detail visibility  150 nm even at high energies. New CT algorithms provide optimum spacial resolution and care for highest precision and time efficiency at a large range of CT applications. With this new release, the systems consequently deliver the best inspection results during the non-destructive testing of materials and furthermore fulfill the most important prerequisites for demanding metrology applications.

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Topics: CT, industrial ct, metrology, NDT, computed tomography

Who’s new at YXLON? I am! Dr. Thomas Wenzel is my name and Industrial Computed Tomography is my expertise.

Posted by Dr. Thomas Wenzel on Aug 4, 2015 9:47:21 AM

For the past 21 years, I have been with the Fraunhofer-Gesellschaft (Europe’s largest application-oriented research organization), and my focus has been on industrial computed tomography. With a doctorate in computer science, and years in research and development projects with multiple companies and detailed insight into their applications, I developed my primary focus on new processes to benefit the industry.  It is with this experience and knowledge, I am confident I can benefit the customers of YXLON and gain further success in this field.

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Topics: CT, industrial ct, metrology, industrial computed tomography

Hexagon Metrology and YXLON International announce cooperation

Posted by Andrea Siems on Apr 23, 2015 7:11:00 AM

Hamburg, Germany / Cobham, UK, April 23, 2015. Industrial measurement solutions leader Hexagon Metrology and YXLON International, the leading industrial X-ray and computed tomography (CT) specialist, announce a close cooperation aiming to leverage X-ray and CT technology to improve industrial measurement.

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Topics: CT, industrial x-ray inspection, metrology, non destructive testing, industrial computed tomography

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