YXLON Blog

YXLON Helps Renault Sport Formula One Team Race to the Finish, Safely

Posted by Dirk Steiner on Nov 16, 2017 12:13:16 PM

Yxlon, together with technical partner Renault Sport, hosted a select group of local NDT users at the Circuit of The Americas raceway on October 19th, 2017 in Austin, TX. This opportunity included of tour of the Renault Sport Formula One garage and pit area, a meet and greet with the team, and the chance to find out more about how the partnership between Renault and Yxlon enhances the performance of the Formula One Team. 

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Topics: NDT, X-ray, MU2000-D, formula one, racecar, sport racing, CT, foundries

600th Standard X-Ray Inspection System YXLON MU2000-D in Operation

Posted by Gina Naujokat on Jul 6, 2017 10:50:36 AM

May 2017: YXLON rejoices over the commissioning of their 600th MU2000-D X-ray inspection system. After its market launch in 1997, the universal radiographic system is still one of the most successful inspection systems worldwide thanks to its flexibility and robustness. Due to continuous developments it has remained state-of-the-art for 20 years now.

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Topics: CT, computed tomography, industrial ct, NDT, industrial x-ray inspection, X-ray

Inauguration of MU2000-D at Renault Formula One Team Technical Centre

Posted by Gina Naujokat on Jul 26, 2016 8:06:34 AM

YXLON International, worldwide leading producer of X-ray and CT systems for industrial applications and Renault Sport Formula One™ Team announce the successful start of their technical partnership. YXLON has provided its proven Y.MU2000-D X-ray system as a premium version which includes the Variofocus X-ray tube, High-Dynamic Radioscopy (HDR) as well as computed tomography (CT). Renault Sport Formula One™ Team can now conduct most of their inspection tasks for quality assurance and R&D with this universal X-ray inspection system, thus optimizing their testing processes.

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Topics: NDT, CT, formula 1, computed tomography, non destructive testing

Advances in X-Ray Inspection For Electronics, Part 3: Microelectronics

Posted by Friedhelm Maur on Jul 21, 2016 8:06:55 AM

A Better Image For Demanding Applications

As new technologies emerge, they push x-ray systems to evolve and adopt new methods of imaging in difficult materials and locations. One of today's more prevalent and demanding areas that x-ray systems has been able to provide a solution is in microelectronics. 

 

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Topics: NDT, Electronics

Advances in X-ray Inspection for Electronics, Part 2: Which Tube?

Posted by Friedhelm Maur on Jun 9, 2016 6:00:00 AM

The Tube Is The Heart of the System

Within the realm of X-ray inspection for electronics there are a wide range of applications, so a single type of X-ray tube is not a "one-size-fits-all" solution. To address the demands of industries such as electronics manufacturing, better X-ray system manufacturers offer various non-destructive test solutions based on the power, kV and feature recognition capabilities electronics producers need. Having a choice of tubes and features allow the makers of chips, boards, circuits and compontents to obtain the images they need to resolve their production issues quickly and accurately.
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Topics: NDT

YXLON International is proud to announce the latest technology advances to their market leading FeinFocus product range for electronics applications.

Posted by Gina Naujokat on Apr 25, 2016 5:05:03 AM

‘Micro3Dslices’ gives operators one of the most accurate Laminography solutions in the market today, surpassing the current market benchmark. Bernhard Muerkens, VP Electronics said: “This exciting technology takes Laminography to a whole new level and gives clearly superior results much faster, really moving this technology into the semiconductor area. The new virtual rotation axis and unprecedented precision of the new manipulator assembly provide unrivalled inspection results, simplified operation and higher inspection throughput.”This solution is much more accurate than previous versions, due, in part, to the quality of design and engineering in the new manipulator assembly, allowing smaller and less dense features to be imaged than it was previously possible. This new technology produces vastly superior laminography results, when compared to other systems which revolve the detector or use inferior manipulators.

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Topics: Y.Cheetah, NDT, SMT, Laminography, Semicon

Enthusiastic response to new wheel inspection system from YXLON

Posted by Gina Naujokat on Mar 29, 2016 7:01:29 AM

Following intensive test operation during production involving more than 250,000 inspected wheels, YXLON has officially launched the new WI26 G wheel inspection system with ADR and the new YXLON Panel 460 detector on the market in the course of its Wheel Symposium 2016. The design for the new WI26 G has been geared for speed, inspection decision-making at its best, and minimum maintenance requirements. “With this wheel inspection system we are able to double our production throughput,” is the enthusiastic commentary from Chris Puhlmann at Borbet Solingen about the concept’s success. At less than 20 seconds of inspection time per standard wheel, an annual throughput of 1.5 million inspected wheels is being applied as the basis. Which makes the WI26 G the fastest X-ray system in its class.

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Topics: industrial x-ray inspection, non destructive testing, NDT, system release, wheel

Advances in X-ray Inspection for Electronics, Part 1: Tubes

Posted by Friedhelm Maur on Mar 22, 2016 9:09:37 AM

Origin Story

The “open” transmission X-ray tube was a major step forward for x-ray inspection. This technology itself is  almost 55 years old, but was adopted for X-ray inspection for electronics in 1982 when the German company Feinfocus introduced the first open Microfocus tube. Most  modern high technology electronics systems use Open Tubes.

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Topics: NDT

Press Release: YXLON CT Systems – Unprecedented detail visibility ≤ 150 nm for precise results during inspection and metrology tasks

Posted by Gina Naujokat on Feb 15, 2016 10:26:01 AM

Hamburg, 15.02.2016. With the new release of the FF20 CT und FF35 CT systems for computed tomography and thanks to a brand-new 190 kV nanofocus tube, YXLON now achieves in the case of 2D applications an as yet unparalleled detail visibility  150 nm even at high energies. New CT algorithms provide optimum spacial resolution and care for highest precision and time efficiency at a large range of CT applications. With this new release, the systems consequently deliver the best inspection results during the non-destructive testing of materials and furthermore fulfill the most important prerequisites for demanding metrology applications.

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Topics: CT, industrial ct, metrology, NDT, computed tomography

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